Evaluate, compare, and secure the reliability of your yield assessments


Posted on: 2025/07/09

 

The PAN ANALYZER now allows you not only to compare .PAN files, but also to assess their reliability. This reduces the margin of error in your yield studies.

The .PAN file is a file extension for the PVSYST software that groups together all the characteristics of the panel, particularly the electrical characteristics, so that you can simulate the production of an entire PV system.

A precise, easy-to-use tool

Easily exploitable data

With the latest PAN ANALYZER update, files are now converted into structured data, presented as tables and charts : 

  • A radar diagram to quickly visualise and compare performance and reliability criteria
  • Graphical representation of low-irradiance behavior and the Incidence Angle Modifier (IAM) to understand their impact on energy yield
  • Comparison of key and advanced parameters such as technology detection, form factor, and bifaciality rate. 

Reliability Assessment Framework

Our analysis does not evaluate a module’s performance, but rather the credibility of the data provided in its .PAN file. The tool has been tested by technical advisors, laboratories, manufacturers, and partner developers. It was built and is continuously updated based on their feedback and on reliable reference values, in line with emerging industry trends.

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